VLSI-Testing
Event no:
L.048.25005/ L.048.92027
Event type:
Lecture V2 + Exercises Ü2
Credit points:
6
Semester:
Summer term
Schedule & Location:
For information on the venue and time of the event, please refer to PAUL
Brief description
The course “VLSI Testing” focuses on techniques for detecting hardware defects in micro-electronic circuits. Algorithms for test data generation and test response evaluation as well as hardware structures for design for test (DFT) and on-chip test implementation (BIST) are presented.
Contents:
- Fault models
- Testability measures and design for test (DFT)
- Logic and fault simulation
- Automatic test pattern generation (ATPG)
- Built-in self-test (BIST), in particular test data compression and test response compaction
- Memory test
Prerequisites:
- Digital Design
