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Wu, Liang;Hussain, Mohammad Khizer;Abughannam, Saed;Müller, Wolfgang;Scheytt, Christoph;Ecker, Wolfgang:

Analog fault simulation automation at schematic level with random sampling techniques.

In: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , Italy/Taormina, 9. - 12. Apr. 2018, IEEE

Weblink

https://ieeexplore.ieee.org/document/8368549/authors#authors

Bibtex

@inproceedings{hniid=9820,
author = {Wu, Liang and Hussain, Mohammad Khizer and Abughannam, Saed and M{\"u}ller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang},
title = {Analog fault simulation automation at schematic level with random sampling techniques},
booktitle = {2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) },
address = {Italy/Taormina},
publisher = {IEEE},
month = {9~-~12~} # apr,
year = {2018},
}

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Permalink

https://www.hni.uni-paderborn.de/pub/9820