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Müller, Wolfgang;Wu, Liang;Scheytt, Christoph;Becker, Markus;Schoenberg, Sven:

On the Correlation of HW Faults and SW Errors.

In: Mueller-Gritschneder, Daniel;Müller, Wolfgang;Mitra, Subhasish (Hrsg.): Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, Okt. 2015

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https://www.edacentrum.de/rees

Bibtex

@inproceedings{hniid=9271,
author = {M{\"u}ller, Wolfgang and Wu, Liang and Scheytt, Christoph and Becker, Markus and Schoenberg, Sven},
title = {On the Correlation of HW Faults and SW Errors},
editor = {Mueller-Gritschneder, Daniel and M{\"u}ller, Wolfgang and Mitra, Subhasish},
booktitle = {Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)},
address = {Amsterdam, Netherland},
month = oct,
year = {2015},
}

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https://www.hni.uni-paderborn.de/pub/9271