For the advance of THz communication systems, the capability to perform precise measurements is crucial. Metrology at THz frequencies is however still in its infancy and as of today it only covers detector calibration for characterization of ultrafast devices and measurement uncertainty analysis of different spectrometer types available at THz frequencies. In the Research Unit METERACOM (Metrology for THz communication (FOR 2863)) a consortium of universities, the Physikalisch-Technische Bundesanstalt (PTB) and the National Physics Laboratory of Great Britain (NPL) addresses major challenges of THz metrology in a systematic way. Target is to establish measurement methods which are traceable to the international system of units (SI), to evaluate THz measurement devices and perform THz system measurements.

Picture1: Chip microphotograph of the optically-switched sampler IC fabricated in silicon photonic BiCMOS technology.

In the project, our group contributes with its expertise to the design of an ultra-low-jitter optoelectronic THz frequency synthesizer. This low jitter frequency synthesizer increases the maximum data rate which is theoretically limited by the jitter of the transceiver’s local oscillator. In addition, our group develops ultra-wide-band optically-switched samplers as well as a new generation of optical Nyquist pulse sampler ICs in an advanced silicon photonics technology.

Further information on the Research Unit METERACOM project can be found here:


Picture2: Block Diagram of the opto-electronic phase locked loop


[1]Meysam Bahmanian and Saeed Fard and Bastian Koppelmann and J. Christoph Scheytt, Ultra Low Phase Noise and Ultra Wide-Band Frequency Synthesizer Using an Optical Clock Source, 2020 IEEE MTT-S International Microwave Symposium, 2020

[2] J. Christoph Scheytt and Dominik Wrana and Dominik Wrana and Ingmar Kallfass, Ultra-Low Phase Noise Frequency Synthesis for THz Communications Using Optoelectronic PLLs, Second International Workshop on Mobile Terahertz Systems (IWMTS), 2020