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Wu, Liang;Abughannam, Saed;Müller, Wolfgang;Scheytt, Christoph;Ecker, Wolfgang:

SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study.

In: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), pp. 68, Lausanne, Switzerland, Mar 2017 REES (Resiliency in Embedded Electronic Systems)

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https://www.edacentrum.de/rees

Bibtex

@inproceedings{hniid=9662,
author = {Wu, Liang and Abughannam, Saed and M{\"u}ller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang},
title = {SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study},
booktitle = {2nd Workshop on Resiliency in Embedded Electronic Systems (REES)},
pages = {68},
address = {Lausanne, Switzerland},
organization = {REES (Resiliency in Embedded Electronic Systems)},
month = mar,
year = {2017},
}

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https://www.hni.uni-paderborn.de/pub/9662